Solid understanding at the nano-scale

The behavior of thin films under mechanical stress is significantly different from that of their bulk equivalent, and it impacts the performance and reliability of your products. A better knowledge of the elastic, plastic and fracture behavior of your materials at small scale helps you avoid trial and error at design stage and bring high performance products faster to market.

MEMS Instruments helps you understand your materials better. With our patented lab-on-chip technology, you can measure the full stress-strain curve of thin films from 50 nm to 1 micron thick, with a precision that cannot be reached with nanoindentation. Your samples are subjected to uniform strain, so that data analysis is straightforward. 

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