Our growing family of lab-on-chips include:

• the F1-IA-xxx series, for the measurement of the plastic/fracture behavior of PVD/CVD thin films in Al, Si3N4, PolySi, Pd, Au, Ag, Cr, Cu, Ni, Mo, Nb, Pt, Ta, TiN, V, W, Tu, DLC, ...
  

The technology is described in the following white papers :

• White paper - Nano-ductility
  

Visit our thin film databook to see our results compared to those from the literature.

In addition to the above products, we provide the following services :

• Technical training and support in the use of our products
• Measurement on behalf of customers
• Measurement of adhesion strength by the superlayer or wedge test technique
• Custom lab-on-chip design or experimental procedure